Enter information to develop plans for a test to demonstrate that only a certain number of failures occur in a set amount of test time. Planning information may come from design specifications, expert opinions, small pilot studies, or other sources.
Each combination of sample size or testing time with a maximum number of failures allowed creates one test plan. You may want to create several test plans by entering multiple values for each property and then compare the results.
Entering 0 results in the smallest sample size and test time. However, if just one failure occurs, the demonstration test fails and you cannot conclude that you have achieved the desired reliability. For more information, go to What is the difference between an m-failure test and a 0-failure test?.
Base your decision abut the distribution on process knowledge or an evaluation of the distribution fit. For more information, go to Distribution fit for reliability analysis.
When testing a redesigned system, you can often use a historical value to estimate the shape or scale parameter of the distribution. The historical value is usually a good estimate because the redesign does not affect this parameter.
The parameter value is an approximate estimate. If, however, the estimate of the parameter is too far from the true value of the parameter, then the sample size or the testing time for the test plan may not be accurate. If you are unsure of the parameter value, consider repeating the test plan analysis using a range of likely values for the assumed parameter. The results from the different analyses can help you to determine how sensitive the sample size or testing time is to the assumed value of the parameter.
| Distribution | Parameter |
|---|---|
| Weibull | Shape: Enter a value greater than 0 for the shape parameter. A value of 1 makes the Weibull distribution equivalent to the exponential distribution. |
| Exponential | N/A |
| Other distributions | Scale value: Enter a value greater than 0 for the scale parameter. |