Accelerated life testing performs a regression with one predictor that is used to model failure times at extreme stress levels and to extrapolate back to normal use conditions. The predictor in the regression is an accelerating variable; its levels are more extreme than those normally used in the field. Use engineering knowledge to find a model that, when estimated under more extreme stress levels, can be used to extrapolate back to normal-use conditions.
Some electrical current will leak between transistors inside an electronic device. If the leakage reaches a certain threshold, the device will short. Electrical current leakage increases under increased temperatures. A manufacturer tests electronic devices to estimate the B5 life at the design temperature of 55° C and at the worst-case temperature of 85° C.
Because the devices should last for several years under normal operating conditions, running them until they fail is not a practical method to test them. To make the devices fail more rapidly, the manufacturer tests them under much higher than normal temperatures. A device fails when its leakage reaches a specified threshold value. The devices are inspected for failure every two days.
The manufacturer chooses a Weibull distribution with an Arrhenius transformation to model the data.