A manufacturer of semiconductors wants to inspect dies on semiconductor wafers from 5 different lots. They give each die a X and Y coordinate, then they inspect the number of defects on each die.
You can use this data to demonstrate Wafer Plot.
Worksheet column | Description |
---|---|
Lot | The lot number of the semiconductor. |
X | The X coordinate of the semiconductor. |
Y | The Y coordinate of the semiconductor. |
Defects | The number of defects on the semiconductor. |